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      Investigation of the effect of thermal cycling on the device performance of YBa2Cu3O7-δ DC-SQUIDs

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      Author
      Avci I.
      Algul, B.P.
      Bozbey, A.
      Akram, R.
      Tepe, M.
      Abukay, D.
      Date
      2007
      Source Title
      Superconductor Science and Technology
      Print ISSN
      0953-2048
      Volume
      20
      Issue
      10
      Pages
      944 - 949
      Language
      English
      Type
      Article
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      Abstract
      We investigated the effect of thermal cycling on the operational performance of YBa2Cu3O7-δ (YBCO) direct current superconducting quantum interference devices (DC-SQUIDs) fabricated onto 24°SrTiO3 (STO) bicrystal substrates. The devices under investigation consist of directly coupled DC-SQUID magnetometer configurations. Thin films having 200nm thicknesses were deposited by dc-magnetron sputtering and device patterns were made by a standard lithography process and chemical etching. The SQUIDs having 4νm-wide grain boundary Josephson junctions (GBJJs) were characterized by means of critical currents, peak-to-peak output voltages and noise levels, depending on the thermal cycles. In order to achieve a protective layer for the junctions against the undesired effects of thermal cycles and ambient atmosphere during the room temperature storage, the devices were coated with a 400nm thick YBCO layer at room temperature. Since the second layer of amorphous YBCO is completely electrically insulating, it does not affect the operation of the junctions and pick-up coils of magnetometers. This two-layered configuration ensures the protection of the junctions from ambient atmosphere as well as from the effect of water molecules interacting with the film structure during each thermal cycle. © IOP Publishing Ltd.
      Keywords
      Critical currents
      Etching
      Lithography
      Magnetron sputtering
      Molecular interactions
      SQUIDs
      Substrates
      Thermal cycling
      DC-magnetron sputtering
      Protective layers
      Yttrium barium copper oxides
      Permalink
      http://hdl.handle.net/11693/23362
      Published Version (Please cite this version)
      http://dx.doi.org/10.1088/0953-2048/20/10/008
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      • Department of Electrical and Electronics Engineering 3337
      • Department of Physics 2149

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