Show simple item record

dc.contributor.authorGürel, L.en_US
dc.contributor.authorErgül, Ö.en_US
dc.date.accessioned2016-02-08T10:02:31Z
dc.date.available2016-02-08T10:02:31Z
dc.date.issued2009en_US
dc.identifier.issn0018-926X
dc.identifier.urihttp://hdl.handle.net/11693/22620
dc.description.abstractWe investigate the accuracy of the combined-field integral equation (CFIE) discretized with the Rao-Wilton-Glisson (RWG) basis functions for the solution of scattering and radiation problems involving three-dimensional conducting objects. Such a low-order discretization with the RWG functions renders the two components of CFIE, i.e., the electric-field integral equation (EFIE) and the magnetic-field integral equation (MFIE), incompatible, mainly because of the excessive discretization error of MFIE. Solutions obtained with CFIE are contaminated with the MFIE inaccuracy, and CFIE is also incompatible with EFIE and MFIE. We show that, in an iterative solution, the minimization of the residual error for CFIE involves a breakpoint, where a further reduction of the residual error does not improve the solution in terms of compatibility with EFIE, which provides a more accurate reference solution. This breakpoint corresponds to the last useful iteration, where the accuracy of CFIE is saturated and a further reduction of the residual error is practically unnecessary.en_US
dc.language.isoEnglishen_US
dc.source.titleIEEE Transactions on Antennas and Propagationen_US
dc.relation.isversionofhttp://doi.org/10.1109/TAP.2009.2024529en_US
dc.subjectAccuracy analysisen_US
dc.subjectCombined-field integral equation (CFIE)en_US
dc.subjectIterative methodsen_US
dc.subjectSurface integral equationsen_US
dc.titleContamination of the accuracy of the combined-field integral equation with the discretization error of the magnetic-field integral equationen_US
dc.typeArticleen_US
dc.departmentComputational Electromagnetics Research Centeren_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage2650en_US
dc.citation.epage2657en_US
dc.citation.volumeNumber57en_US
dc.citation.issueNumber9en_US
dc.identifier.doi10.1109/TAP.2009.2024529en_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.identifier.eissn1558-2221


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record