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dc.contributor.authorDâna, A.en_US
dc.date.accessioned2016-02-08T10:00:55Z
dc.date.available2016-02-08T10:00:55Z
dc.date.issued2009en_US
dc.identifier.issn1694332
dc.identifier.urihttp://hdl.handle.net/11693/22499
dc.description.abstractWe describe in detail a model that can be used to estimate the X-ray photoelectron spectroscopic data of surfaces when a time varying bias or a modulation of the electrical properties of the surface is applied by external stimulation, in the presence of a neutralizing electron beam. Using the model and spectra recorded under periodic sample bias modulation, certain electronic properties related to charging dynamics of the surface can be estimated. The resulting technique is a non-contact impedance measurement technique with chemical specificity. Typical behavior of spectra under a square wave bias is given. Alternative modulation schemes are investigated, including small-signal square wave modulation, sinusoidal modulation and modulation of sample resistivity under fixed bias. © 2009 Elsevier B.V. All rights reserved.en_US
dc.language.isoEnglishen_US
dc.source.titleApplied Surface Scienceen_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/j.apsusc.2009.10.027en_US
dc.subjectAlternative modulationen_US
dc.subjectCharging dynamicsen_US
dc.subjectChemical specificityen_US
dc.subjectElectrical propertyen_US
dc.subjectExternal stimulationen_US
dc.subjectLine shapeen_US
dc.subjectNon-contacten_US
dc.subjectPeriodic samplesen_US
dc.subjectSinusoidal modulationen_US
dc.subjectSmall signalen_US
dc.subjectSpectroscopic dataen_US
dc.subjectSquare wave modulationen_US
dc.subjectSquare wavesen_US
dc.subjectTime varyingen_US
dc.subjectX-ray photoelectronsen_US
dc.subjectElectric propertiesen_US
dc.subjectElectromagnetic wavesen_US
dc.subjectElectron beamsen_US
dc.subjectElectronic propertiesen_US
dc.subjectModulationen_US
dc.subjectPhotoionizationen_US
dc.subjectPhotonsen_US
dc.subjectX ray photoelectron spectroscopyen_US
dc.titleLineshapes, shifts and broadenings in dynamical X-ray photoelectron spectroscopyen_US
dc.typeArticleen_US
dc.departmentUNAM - Institute of Materials Science and Nanotechnology
dc.departmentDepartment of Electrical and Electronics Engineering
dc.citation.spage1289en_US
dc.citation.epage1295en_US
dc.citation.volumeNumber256en_US
dc.citation.issueNumber5en_US
dc.identifier.doi10.1016/j.apsusc.2009.10.027en_US


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