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dc.contributor.authorFrantz, G.en_US
dc.contributor.authorHenkel, J.en_US
dc.contributor.authorRabaey, J.en_US
dc.contributor.authorSchneider, T.en_US
dc.contributor.authorWolf, M.en_US
dc.contributor.authorBatur, U.en_US
dc.date.accessioned2016-02-08T09:59:54Z
dc.date.available2016-02-08T09:59:54Z
dc.date.issued2010en_US
dc.identifier.issn1053-5888 (print)en_US
dc.identifier.urihttp://hdl.handle.net/11693/22422
dc.description.abstractThis IEEE Signal Processing Magazine (SPM) forum discusses the latest advances and challenges in ultra-low power (ULP) signal processing (SP). The forum members bring their expert insights to issues such as design requirements and future applications of ULP SP systems. The invited forum members are Gene Frantz (Texas Instruments), Jorg Henkel (Karlsruhe Institute of Technology), Jan Rabaey (University of California at Berkeley), Todd Schneider (ON Semiconductor), and Marilyn Wolf (Georgia Institute of Technology). The moderator of the forum is Umit Batur (Texas Instruments). Our readers may agree or disagree with the ideas discussed next. In either case, we invite you to share your comments with us by e-mailing batur@ti.com or spm.columns. forums@gmail.com. © 2006 IEEE.en_US
dc.language.isoEnglishen_US
dc.source.titleIEEE Signal Processing Magazineen_US
dc.relation.isversionofhttps://doi.org/10.1109/MSP.2009.935417en_US
dc.subjectDesign requirementsen_US
dc.subjectFuture applicationsen_US
dc.subjectGeorgia Institute of Technologyen_US
dc.subjectSchneideren_US
dc.subjectSignal processing magazineen_US
dc.subjectTexas instrumentsen_US
dc.subjectUltra-low poweren_US
dc.subjectUniversity of Californiaen_US
dc.subjectSignal processingen_US
dc.titleUltra-low power signal processingen_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage149en_US
dc.citation.epage154en_US
dc.citation.volumeNumber27en_US
dc.citation.issueNumber2en_US
dc.identifier.doi10.1109/MSP.2009.935417en_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US


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