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dc.contributor.authorAlici, K. B.en_US
dc.contributor.authorÖzbay, Ekmelen_US
dc.date.accessioned2016-02-08T09:59:50Z
dc.date.available2016-02-08T09:59:50Z
dc.date.issued2009-10-23en_US
dc.identifier.issn1077-260X
dc.identifier.urihttp://hdl.handle.net/11693/22418
dc.description.abstractWe designed a low-loss double-negative composite metamaterial that operates at the millimeter-wave regime. A negative passband with a peak transmission value of 2.7 dB was obtained experimentally at 100 GHz. We performed transmission-based qualitative effective medium theory analysis numerically and experimentally to prove the double-negative nature of the metamaterial. These results were supported by the standard retrieval analysis method and the study was extended by reporting the fractional bandwidth and loss of the metamaterial as the number of layers in the propagation direction increased. We numerically calculated 2-D field map and experimentally confirmed far-field radiation response of horn antenna and metamaterial lens composite. Finally, we demonstrated that the effective index of the metamaterial was negative by performing far-field angular scanning measurements for a metamaterial prism. We simulated the prism by using the DrudeLorentz model and obtained the scattered field map in two dimensions at millimeter-wavelengths.en_US
dc.description.sponsorshipTUBITAKen_US
dc.language.isoEnglishen_US
dc.source.titleIEEE Journal on Selected Topics in Quantum Electronicsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/JSTQE.2009.2032668en_US
dc.subjectMetamaterialsen_US
dc.subjectMetaprismen_US
dc.subjectMillimeter waveen_US
dc.subjectNegative refractionen_US
dc.titleTheoretical study and experimental realization of a low-loss metamaterial operating at the millimeter-wave regime: demonstrations of flat-and prism-shaped samplesen_US
dc.typeArticleen_US
dc.departmentNANOTAM - Nanotechnology Research Center
dc.departmentDepartment of Electrical and Electronics Engineering
dc.departmentDepartment of Physics
dc.citation.spage386en_US
dc.citation.epage393en_US
dc.citation.volumeNumber16en_US
dc.citation.issueNumber2en_US
dc.identifier.doi10.1109/JSTQE.2009.2032668en_US
dc.publisherIEEEen_US
dc.contributor.bilkentauthorÖzbay, Ekmelen_US


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