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      Metamaterial based telemetric strain sensing in different materials

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      Author
      Melik, R.
      Unal, E.
      Perkgoz, N.K.
      Puttlitz, C.
      Demir, Hilmi Volkan
      Date
      2010
      Source Title
      Optics Express
      Print ISSN
      10944087
      Publisher
      Optical Society of American (OSA)
      Volume
      18
      Issue
      5
      Pages
      5000 - 5007
      Language
      English
      Type
      Article
      Item Usage Stats
      128
      views
      85
      downloads
      Abstract
      We present telemetric sensing of surface strains on different industrial materials using split-ring-resonator based metamaterials. For wireless strain sensing, we utilize metamaterial array architectures for high sensitivity and low nonlinearity-errors in strain sensing. In this work, telemetric strain measurements in three test materials of cast polyamide, derlin and polyamide are performed by observing operating frequency shift under mechanical deformation and these data are compared with commercially-available wired strain gauges. We demonstrate that hard material (cast polyamide) showed low slope in frequency shift vs. applied load (corresponding to high Young's modulus), while soft material (polyamide) exhibited high slope (low Young's modulus).
      Keywords
      Elastic moduli
      Elasticity
      Electronic equipment
      Frequency shift keying
      Materials
      Metamaterials
      Position measurement
      Strain gages
      Applied loads
      Array architecture
      Frequency shift
      Hard material
      High sensitivity
      High slopes
      Industrial materials
      Low young's modulus
      Mechanical deformation
      Non-Linearity
      Operating frequency
      Soft material
      Strain gauge
      Strain sensing
      Surface strains
      Test materials
      Young's Modulus
      Strain
      Permalink
      http://hdl.handle.net/11693/22411
      Published Version (Please cite this version)
      http://dx.doi.org/10.1364/OE.18.005000
      Collections
      • Department of Electrical and Electronics Engineering 3524
      • Department of Physics 2299
      • Institute of Materials Science and Nanotechnology (UNAM) 1775
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