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      Methods for probing charging properties of polymeric materials using XPS

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      Author
      Sezen, H.
      Ertas, G.
      Süzer, Şefik
      Date
      2010
      Source Title
      Journal of Electron Spectroscopy and Related Phenomena
      Print ISSN
      0368-2048
      Electronic ISSN
      1873-2526
      Volume
      178-179
      Issue
      C
      Pages
      373 - 379
      Language
      English
      Type
      Article
      Item Usage Stats
      148
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      108
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      Abstract
      Various thin polystyrene, PS, and poly(methyl methacrylate), PMMA and PS + PMMA blend films have been examined using the technique of recording X-ray photoelectron spectrum while the sample is subjected to ±10 V d.c. bias, and three different forms of (square-wave (SQW), sinusoidal (SIN) and triangular (TRG)), a.c. pulses. All films exhibit charging shifts as observed in the position of the corresponding C1s peak under d.c. bias. The a.c. pulses convert the single C1s peak to twinned peaks in the case of the square-wave form, and distort severely in the cases of the SIN, and TRG forms, and all three of them exhibit strong frequency dependence. In order to mimic and better understand the behavior of these polymeric materials, an artificial dielectric system consisting of a clean Si-wafer coupled to an external 1 MΩ resistor and 56 nF capacitor is created, and its response to different forms of voltage stimuli, is examined in detail. A simple electrical circuit model is also developed treating the system as consisting of a parallel resistor and a series capacitor. With the help of the model, the response of the artificial system is successfully calculated as judged by comparison with the experimental data. Using one high frequency SQW measurements, the off-set in the charging shift due to the extra low-energy neutralizing electrons is estimated. After correcting the corresponding off-set shifts, the XPS spectra of the three different PS films, one PMMA, and one PS + PMMA blend film are re-examined. As a result of these detailed analysis, there emerges a clear relationship between the thicknesses of the PS films with their charging abilities. In the blend film, PS and PMMA domains are electrically separated, and exhibit different charging shifts, however, the presence of one is felt by the other. Hence, the PS component shifts are larger in the blend, due to the presence of PMMA domains, which has intrinsically a larger Reff, and conversely the PMMA component shifts are smaller due to the presence of PS domains.
      Keywords
      Charging
      Dielectric properties
      Dynamics of charging
      Polymeric matreials
      Reseistance
      Artificial dielectric
      Artificial systems
      Blend films
      Charging property
      Electrical circuit models
      Experimental data
      Frequency dependence
      High frequency
      Low energies
      Series capacitors
      Si wafer
      Square-wave
      X ray photoelectron spectra
      XPS
      XPS spectra
      Capacitance
      Capacitors
      Dielectric materials
      Dielectric properties
      Esters
      Materials properties
      Polystyrenes
      Resistors
      Semiconducting silicon compounds
      Silicon wafers
      X ray photoelectron spectroscopy
      Polymers
      Permalink
      http://hdl.handle.net/11693/22328
      Published Version (Please cite this version)
      http://dx.doi.org/10.1016/j.elspec.2009.04.003
      Collections
      • Department of Chemistry 616
      • Institute of Materials Science and Nanotechnology (UNAM) 1831
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