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dc.contributor.authorCakmakyapan, S.en_US
dc.contributor.authorCaglayan, H.en_US
dc.contributor.authorSerebryannikov, A. E.en_US
dc.contributor.authorÖzbay, Ekmelen_US
dc.date.accessioned2016-02-08T09:54:43Z
dc.date.available2016-02-08T09:54:43Z
dc.date.issued2011-02-02en_US
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/11693/22045
dc.description.abstractStrong directional selectivity is theoretically predicted and experimentally validated at the microwave frequencies in the beaming regime for a single subwavelength slit in nonsymmetric metallic gratings with double-side corrugations. The operation regime can be realized at a fixed angle of incidence when the surface-plasmon assisted transmission is significant within a narrow range of observation angles, if illuminating one of the grating interfaces, and tends to vanish for all observation angles, if illuminating the opposite interface. The studied effect is connected with asymmetry (nonreciprocity) in the beaming that occurs if the surface plasmon properties are substantially different for the two interfaces being well isolated from each other.en_US
dc.language.isoEnglishen_US
dc.source.titleApplied Physics Lettersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.3552675en_US
dc.subjectDirectional selectivityen_US
dc.subjectExperimental validationsen_US
dc.subjectFixed anglesen_US
dc.subjectMetallic gratingsen_US
dc.subjectNonreciprocityen_US
dc.subjectNonsymmetricen_US
dc.subjectObservation angleen_US
dc.subjectOperation regimeen_US
dc.subjectSubwavelength slitsen_US
dc.subjectSurface plasmonsen_US
dc.subjectSurface-plasmonen_US
dc.subjectDiffraction gratingsen_US
dc.subjectPlasmonsen_US
dc.titleExperimental validation of strong directional selectivity in nonsymmetric metallic gratings with a subwavelength sliten_US
dc.typeArticleen_US
dc.departmentDepartment of Physicsen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentNanotechnology Research Center (NANOTAM)en_US
dc.citation.spage051103-1en_US
dc.citation.epage051103-3en_US
dc.citation.volumeNumber98en_US
dc.citation.issueNumber5en_US
dc.identifier.doi10.1063/1.3552675en_US
dc.publisherAmerican Institute of Physicsen_US
dc.contributor.bilkentauthorÖzbay, Ekmel


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