Show simple item record

dc.contributor.authorAksoy, M. D.en_US
dc.contributor.authorAtalar, Abdullahen_US
dc.date.accessioned2016-02-08T09:54:25Z
dc.date.available2016-02-08T09:54:25Z
dc.date.issued2011-02-15en_US
dc.identifier.issn1098-0121
dc.identifier.urihttp://hdl.handle.net/11693/22023
dc.description.abstractWe propose a force-spectroscopy technique where a higher order mode of a cantilever is excited simultaneously with the first. Resonance tracking of both vibration modes through a frequency modulation scheme provides a way to extract topographical information and the gradient of the tip-sample interaction within a single surface scan. We provide an analytic treatment of the scheme, derive expressions relating frequency shifts of the higher mode and the tip-sample forces, and offer two methods of improving the accuracy of reconstruction of the force gradient. Finally, we confirm our predictions by numerical simulations.en_US
dc.language.isoEnglishen_US
dc.source.titlePhysical Review Ben_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevB.83.075416en_US
dc.titleForce spectroscopy using bimodal frequency modulation atomic force microscopyen_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.volumeNumber83en_US
dc.citation.issueNumber7en_US
dc.identifier.doi10.1103/PhysRevB.83.075416en_US
dc.publisherAmerican Physical Societyen_US
buir.contributor.orcidAtalar, Abdullah|0000-0002-1903-1240en_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record