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      • Department of Electrical and Electronics Engineering
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      Force spectroscopy using bimodal frequency modulation atomic force microscopy

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      Author
      Aksoy, M. D.
      Atalar, Abdullah
      Date
      2011-02-15
      Source Title
      Physical Review B
      Print ISSN
      1098-0121
      Publisher
      American Physical Society
      Volume
      83
      Issue
      7
      Language
      English
      Type
      Article
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      Abstract
      We propose a force-spectroscopy technique where a higher order mode of a cantilever is excited simultaneously with the first. Resonance tracking of both vibration modes through a frequency modulation scheme provides a way to extract topographical information and the gradient of the tip-sample interaction within a single surface scan. We provide an analytic treatment of the scheme, derive expressions relating frequency shifts of the higher mode and the tip-sample forces, and offer two methods of improving the accuracy of reconstruction of the force gradient. Finally, we confirm our predictions by numerical simulations.
      Permalink
      http://hdl.handle.net/11693/22023
      Published Version (Please cite this version)
      http://dx.doi.org/10.1103/PhysRevB.83.075416
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      • Department of Electrical and Electronics Engineering 3637
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