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      Nanomechanical characterization by double-pass force-distance mapping

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      Author(s)
      Dagdas, Yavuz S.
      Aslan, M. N.
      Tekinay, Ayse B.
      Güler, Mustafa O.
      Dâna, Aykutlu
      Date
      2011
      Source Title
      Nanotechnology
      Print ISSN
      0957-4484
      Electronic ISSN
      1361-6528
      Publisher
      Institute of Physics Publishing
      Volume
      22
      Issue
      29
      Pages
      295704-1 - 295704-5
      Language
      English
      Type
      Article
      Item Usage Stats
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      Abstract
      We demonstrate high speed force-distance mapping using a double-pass scheme. The topography is measured in tapping mode in the first pass and this information is used in the second pass to move the tip over the sample. In the second pass, the cantilever dither signal is turned off and the sample is vibrated. Rapid (few kHz frequency) force-distance curves can be recorded with small peak interaction force, and can be processed into an image. Such a double-pass measurement eliminates the need for feedback during force-distance measurements. The method is demonstrated on self-assembled peptidic nanofibers. © 2011 IOP Publishing Ltd.
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      http://hdl.handle.net/11693/21851
      Published Version (Please cite this version)
      http://dx.doi.org/10.1088/0957-4484/22/29/295704
      Collections
      • Aysel Sabuncu Brain Research Center (BAM) 213
      • Institute of Materials Science and Nanotechnology (UNAM) 1930
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