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dc.contributor.authorAkar, N.en_US
dc.contributor.authorSohraby, K.en_US
dc.date.accessioned2016-02-08T09:50:53Z
dc.date.available2016-02-08T09:50:53Z
dc.date.issued2011en_US
dc.identifier.issn0090-6778
dc.identifier.urihttp://hdl.handle.net/11693/21767
dc.description.abstractOptical buffers based on Fiber Delay Lines (FDL) have been proposed for contention resolution in optical packet/burst switching systems. In this article, we propose a retrial queuing model for FDL optical buffers in asynchronous optical switching nodes. In the considered system, the reservation model employed is of post-reservation type and optical packets are allowed to re-circulate over the FDLs in a probabilistic manner. We combine the MMPP-based overflow traffic models of the classical circuit switching literature and fixed-point iterations to devise an algorithmic procedure to accurately estimate blocking probabilities as a function of various buffer parameters in the system when packet arrivals are Poisson and packet lengths are exponentially distributed. The proposed algorithm is both accurate and fast, allowing one to use the procedure to dimension optical buffers in next-generation optical packet switching systems.en_US
dc.language.isoEnglishen_US
dc.source.titleIEEE Transactions on Communicationsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/TCOMM.2011.071111.100521en_US
dc.subjectFiber Delay Line (FDL) re-circulation bufferen_US
dc.subjectMarkov modulated Poisson processen_US
dc.subjectOptical burst switchingen_US
dc.subjectOptical packet switchingen_US
dc.subjectRetrial queuesen_US
dc.subjectMarkov modulated Poisson processen_US
dc.subjectRecirculationsen_US
dc.subjectPoisson distributionen_US
dc.subjectQueueing theoryen_US
dc.subjectSwitching systemsen_US
dc.titleRetrial queuing models of multi-wavelength FDL feedback optical buffersen_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage2832en_US
dc.citation.epage2840en_US
dc.citation.volumeNumber59en_US
dc.citation.issueNumber10en_US
dc.identifier.doi10.1109/TCOMM.2011.071111.100521en_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US


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