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dc.contributor.authorYilmaz, E.en_US
dc.contributor.authorSezen, H.en_US
dc.contributor.authorSuzer, S.en_US
dc.date.accessioned2016-02-08T09:46:40Z
dc.date.available2016-02-08T09:46:40Z
dc.date.issued2012en_US
dc.identifier.issn1433-7851
dc.identifier.urihttp://hdl.handle.net/11693/21462
dc.description.abstractWhat's the charge? X‐ray photoelectron spectroscopy was used to determine the charge state and dynamics of charge build‐up and decay on a thin poly(methyl methacrylate) film. The film is initially negatively charged to around −2 V and becomes progressively positively charged during the course of the XPS analysis.en_US
dc.language.isoEnglishen_US
dc.source.titleAngewandte Chemie - International Editionen_US
dc.relation.isversionofhttp://dx.doi.org/10.1002/anie.201201351en_US
dc.titleProbing the charge build-up and dissipation on thin PMMA film surfaces at the molecular level by XPSen_US
dc.typeArticleen_US
dc.departmentDepartment of Chemistryen_US
dc.citation.spage5488en_US
dc.citation.epage5492en_US
dc.citation.volumeNumber51en_US
dc.citation.issueNumber22en_US
dc.identifier.doi10.1002/anie.201201351en_US
dc.publisherWileyen_US
dc.identifier.eissn1521-3773


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