CeOx/Al2O3 thin films on stainless steel substrate - Dynamical X-ray photoelectron spectroscopy investigations
Please cite this item using this persistent URLhttp://hdl.handle.net/11693/20946
Thin Solid Films
- Research Paper 
The CeOx/Al2O3 thin films on stainless steel with different ceria loading were subjected to a.c. (square wave) pulses at various frequencies in the range 10- 3 to 100 kHz while recording X-ray photoelectron spectra. The resulting binding energy differences were derived from the frequency dependence of the corresponding Al2p, Ce3d and O1s peaks. At low ceria loadings the main constituent on the surface is CeAlO 3 phase, while for high ceria loading the film is constructed from CeO2 and CeAlO3 phases spread over the Al 2O3. Accordingly, it was observed that the ceria loading determines the conductivities of the investigated thin oxide films. © 2013 Elsevier B.V. All Rights Reserved.
Showing items related by title, author, creator and subject.
Suzer, S.; Toppare L.; Allen G.C.; Hallam, K.R. (Elsevier, 1995)X-ray photoelectron spectrum of the electrochemically prepared polypyrrole and polypyrrole-polyamide composite films exhibit an additional strong high binding energy peak at 402.0 eV corresponding to N+ moieties. Intensity ...
Probing the charge build-up and dissipation on thin PMMA film surfaces at the molecular level by XPS Yilmaz, E.; Sezen H.; Suzer, S. (2012)What's the charge? X-ray photoelectron spectroscopy was used to determine the charge state and dynamics of charge build-up and decay on a thin poly(methyl methacrylate) film. The film is initially negatively charged to ...
Voltage contrast X-ray photoelectron spectroscopy reveals graphene-substrate interaction in graphene devices fabricated on the C- and Si- faces of SiC Aydogan P.; Arslan, E.; Cakmakyapan, S.; Ozbay, E.; Strupinski W.; Suzer, S. (American Institute of Physics Inc., 2015)We report on an X-ray photoelectron spectroscopy (XPS) study of two graphene based devices that were analyzed by imposing a significant current under +3 V bias. The devices were fabricated as graphene layers(s) on hexagonal ...