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dc.contributor.authorUluutku, B.en_US
dc.contributor.authorBaykara, M. Z.en_US
dc.date.accessioned2016-02-08T09:37:47Z
dc.date.available2016-02-08T09:37:47Z
dc.date.issued2013en_US
dc.identifier.issn1071-1023
dc.identifier.urihttp://hdl.handle.net/11693/20907
dc.description.abstractAtomic force microscopy is being increasingly used to measure atomic-resolution force fields on sample surfaces, making correct interpretation of resulting data critically important. In addition to asymmetry, elastic deformations undergone by the microscope tip are thought to affect measurements. In this study, simple analytical potentials and a model tip apex were used to theoretically analyze how lateral tip stiffness affects force spectroscopy on the surface of NaCl(001). The results suggest that lateral deformations experienced by the tip lead to certain distortions in measured force spectra, the degree of which depends on lateral tip stiffness. © 2013 American Vacuum Society.en_US
dc.language.isoEnglishen_US
dc.source.titleJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structuresen_US
dc.relation.isversionofhttp://dx.doi.org/10.1116/1.4807376en_US
dc.titleEffect of lateral tip stiffness on atomic-resolution force field spectroscopyen_US
dc.typeArticleen_US
dc.departmentDepartment of Mechanical Engineering
dc.departmentUNAM - Institute of Materials Science and Nanotechnology
dc.citation.volumeNumber31en_US
dc.citation.issueNumber4en_US
dc.identifier.doi10.1116/1.4807376en_US
dc.publisherAmerican Vacuum Societyen_US


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