Scanning probe microscopy for optoelectronic characterization at the nanoscale
Author(s)
Advisor
Çıracı, SalimDate
2010Publisher
Bilkent University
Language
English
Type
ThesisItem Usage Stats
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Abstract
In this work, we propose methods for electrical characterization of nanostructured
surfaces using electrostatic force and tunneling current measurements in
scanning probe microscopy. Resolution smaller than 10 nm in electrostatic force
microscopy (EFM) is attained and reasons for this attainment is explained in
terms of the tip-sample capacitance and mechanical vibrations of tip design. Dynamic
measurements are done in EFM using a lumped model for tip-sample
electrostatic interaction instead of a simple tip-sample capacitance model. Surface
photovoltage measurements are done and assured in EFM using frequency
response techniques. Also, combining tunneling current measurements by EFM
measurements, optoelectonic properties of graphene/graphene oxide samples are
characterized.
Keywords
Electrostatic force microscopyScanning Tunneling Microscopy
Graphene
Graphene oxide
Surface Photovoltage