• About
  • Policies
  • What is open access
  • Library
  • Contact
Advanced search
      View Item 
      •   BUIR Home
      • University Library
      • Bilkent Theses
      • Theses - Graduate Program in Materials Science and Nanotechnology
      • Graduate Program in Materials Science and Nanotechnology - Master's degree
      • View Item
      •   BUIR Home
      • University Library
      • Bilkent Theses
      • Theses - Graduate Program in Materials Science and Nanotechnology
      • Graduate Program in Materials Science and Nanotechnology - Master's degree
      • View Item
      JavaScript is disabled for your browser. Some features of this site may not work without it.

      Scanning probe microscopy for optoelectronic characterization at the nanoscale

      Thumbnail
      View / Download
      2.2 Mb
      Author(s)
      Ürel, Mustafa
      Advisor
      Çıracı, Salim
      Date
      2010
      Publisher
      Bilkent University
      Language
      English
      Type
      Thesis
      Item Usage Stats
      157
      views
      47
      downloads
      Abstract
      In this work, we propose methods for electrical characterization of nanostructured surfaces using electrostatic force and tunneling current measurements in scanning probe microscopy. Resolution smaller than 10 nm in electrostatic force microscopy (EFM) is attained and reasons for this attainment is explained in terms of the tip-sample capacitance and mechanical vibrations of tip design. Dynamic measurements are done in EFM using a lumped model for tip-sample electrostatic interaction instead of a simple tip-sample capacitance model. Surface photovoltage measurements are done and assured in EFM using frequency response techniques. Also, combining tunneling current measurements by EFM measurements, optoelectonic properties of graphene/graphene oxide samples are characterized.
      Keywords
      Electrostatic force microscopy
      Scanning Tunneling Microscopy
      Graphene
      Graphene oxide
      Surface Photovoltage
      Permalink
      http://hdl.handle.net/11693/15406
      Collections
      • Graduate Program in Materials Science and Nanotechnology - Master's degree 162
      Show full item record

      Browse

      All of BUIRCommunities & CollectionsTitlesAuthorsAdvisorsBy Issue DateKeywordsTypeDepartmentsCoursesThis CollectionTitlesAuthorsAdvisorsBy Issue DateKeywordsTypeDepartmentsCourses

      My Account

      Login

      Statistics

      View Usage StatisticsView Google Analytics Statistics

      Bilkent University

      If you have trouble accessing this page and need to request an alternate format, contact the site administrator. Phone: (312) 290 2976
      © Bilkent University - Library IT

      Contact Us | Send Feedback | Off-Campus Access | Admin | Privacy