dc.contributor.advisor | Bayındır, Mehmet | |
dc.contributor.author | Aktaş, Ozan | |
dc.date.accessioned | 2016-01-08T18:07:35Z | |
dc.date.available | 2016-01-08T18:07:35Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | http://hdl.handle.net/11693/14762 | |
dc.description | Ankara : The Department of Physics and the Institute of Engineering and Science of Bilkent University, 2008. | en_US |
dc.description | Thesis (Master's) -- Bilkent University, 2008. | en_US |
dc.description | Includes bibliographical references leaves 100-103. | en_US |
dc.description.abstract | In the recent years, progress in atomic force microscopy (AFM) led to the multifrequency
imaging paradigm in which the cantilever-tip ensemble is simultaneously
excited by several driving forces of different frequencies. By using multifrequency
excitation, various interaction forces of different physical origin such
as electronic interactions or chemical interactions can be simultaneously mapped
along with topography. However, a multifrequency magnetic imaging technique
has not been demonstrated yet. The difficulty in imaging magnetic forces using
a multifrequency technique partly arises from difficulties in modulation of the
magnetic tip-sample interaction. In the traditional unmodulated scheme, measurement
of magnetic forces and elimination of coupling with other forces is obtained
in a double pass measurement technique where topography and magnetic
interactions are rapidly measured in successive scans with different tip-sample
separations. This measurement scheme may suffer from thermal drifts or topographical
artifacts. In this work, we consider a multifrequency magnetic imaging
method which uses first resonant flexural mode for topography signal acquisition
and second resonant flexural mode for measuring the magnetic interaction
simultaneously. As in a fluxgate magnetometer, modulation of magnetic moment
of nickel particles attached on the apex of AFM tip can be used to modulate
the magnetic forces which are dependent on external DC fields through the nonlinear
magnetic response of the nickel particles. Coupling strength can be varied
by changing coil current or setpoint parameters of Magnetic Force Microscopy
(MFM) system. Special MFM tips were fabricated by using Focused Ion Beam
(FIB) and magnetically characterized for the purpose of multifrequency imaging.
In this work, the use of such a nano-flux-gate system for simultaneous topographic
and magnetic imaging is experimentally demonstrated. The excitation and detection
scheme can be also used for high sensitivity cantilever magnetometry. | en_US |
dc.description.statementofresponsibility | Aktaş, Ozan | en_US |
dc.format.extent | xxii, 114 leaves, illustrations, graphs | en_US |
dc.language.iso | English | en_US |
dc.rights | info:eu-repo/semantics/openAccess | en_US |
dc.subject | Magnetic Force Microscopy (MFM) | en_US |
dc.subject | Fluxgate Magnetometry | en_US |
dc.subject | Multi-frequency Imaging | en_US |
dc.subject.lcc | QC753 .A58 2008 | en_US |
dc.subject.lcsh | Magnetic resonance force microscopy. | en_US |
dc.subject.lcsh | Magnetic materials. | en_US |
dc.title | Multi-frequency fluxgate magnetic force microscopy | en_US |
dc.type | Thesis | en_US |
dc.department | Department of Physics | en_US |
dc.publisher | Bilkent University | en_US |
dc.description.degree | M.S. | en_US |