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dc.contributor.authorDeprem, Z.en_US
dc.contributor.authorÇetin, A. E.en_US
dc.date.accessioned2015-07-28T12:02:46Z
dc.date.available2015-07-28T12:02:46Z
dc.date.issued2015-01en_US
dc.identifier.issn0018-9251
dc.identifier.urihttp://hdl.handle.net/11693/12728
dc.description.abstractA crucial aspect of time-frequency (TF) analysis is the identification of separate components in a multicomponent signal. The Wigner-Ville distribution is the classical tool for representing such signals, but it suffers from cross-terms. Other methods, which are members of Cohen's class of distributions, also aim to remove the cross-terms by masking the ambiguity function (AF), but they result in reduced resolution. Most practical time-varying signals are in the form of weighted trajectories on the TF plane, and many others are sparse in nature. Therefore, in recent studies the problem is cast as TF distribution reconstruction using a subset of AF domain coefficients and sparsity assumption. Sparsity can be achieved by constraining or minimizing the l(1) norm. In this article, an l(1) minimization approach based on projections onto convex sets is proposed to obtain a high-resolution, cross-term-free TF distribution for a given signal. The new method does not require any parameter adjustment to obtain a solution. Experimental results are presented.en_US
dc.language.isoEnglishen_US
dc.source.titleIEEE Transactions on Aerospace and Electronic Systemsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/TAES.2014.140080en_US
dc.subjectFourier - transformen_US
dc.subjectWigner distributionen_US
dc.subjectSignature analysisen_US
dc.subjectFault - detectionen_US
dc.subjectStator currenten_US
dc.subjectRadaren_US
dc.subjectAlgorithmen_US
dc.subjectSignalsen_US
dc.subjectRepresentationsen_US
dc.subjectInformationen_US
dc.titleCross-term-free time-frequency distribution reconstruction via lifted projectionsen_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage479en_US
dc.citation.epage491en_US
dc.citation.volumeNumber51en_US
dc.citation.issueNumber1en_US
dc.identifier.doi10.1109/TAES.2014.140080en_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US


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