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dc.contributor.authorGundogdu, T. F.en_US
dc.contributor.authorGuven, K.en_US
dc.contributor.authorGokkavas, M.en_US
dc.contributor.authorSoukoulis, C. M.en_US
dc.contributor.authorÖzbay, Ekmelen_US
dc.date.accessioned2015-07-28T11:59:11Z
dc.date.available2015-07-28T11:59:11Z
dc.date.issued2009-10-02en_US
dc.identifier.issn1077-260X
dc.identifier.urihttp://hdl.handle.net/11693/11887
dc.description.abstractWe report the fabrication and electromagnetic characterization of a planar composite metamaterial (CMM) that is designed to achieve dual-frequency double-negative response at the lower end of the extremely high-frequency (EHF) band. The CMM is based on cut wire pairs and continuous wire elements. Dual-frequency operation is obtained by employing cut wire pairs of two different lengths within the unit cell of the CMM. The magnetic response of the cut wire pairs and the left-handed transmission band of the CMM are demonstrated by experiment and numerical simulations. It is found that the combined electric response of the dual-band CMM is complicated and imposes certain restrictions to the structure design in achieving true left-handed response at both designated frequencies.en_US
dc.language.isoEnglishen_US
dc.source.titleIEEE Journal of Selected Topics in Quantum Electronicsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/JSTQE.2009.2031618en_US
dc.subjectElectromagnetic propagationen_US
dc.subjectMetamaterialen_US
dc.subjectNegative refractive indexen_US
dc.titleA planar metamaterial with dual-band double-negative response at EHFen_US
dc.typeArticleen_US
dc.departmentDepartment of Physicsen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentNanotechnology Research Center (NANOTAM)en_US
dc.citation.spage376en_US
dc.citation.epage379en_US
dc.citation.volumeNumber16en_US
dc.citation.issueNumber2en_US
dc.identifier.doi10.1109/JSTQE.2009.2031618en_US
dc.publisherIEEEen_US
dc.contributor.bilkentauthorÖzbay, Ekmel
buir.contributor.orcidÖzbay, Ekmel|0000-0003-2953-1828en_US


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