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      A photometric investigation of ultra-efficient LEDs with high color rendering index and high luminous efficacy employing nanocrystal quantum dot luminophores

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      Author(s)
      Erdem, T.
      Nizamoglu, S.
      Sun, X. W.
      Demir, Hilmi Volkan
      Date
      2009-12-24
      Source Title
      Optics Express
      Print ISSN
      1094-4087
      Publisher
      Optical Society of America
      Volume
      18
      Issue
      1
      Pages
      340 - 347
      Language
      English
      Type
      Article
      Item Usage Stats
      186
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      136
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      Abstract
      We report a photometric study of ultra-efficient light emitting diodes (LEDs) that exhibit superior color rendering index (CRI) and luminous efficacy of optical radiation (LER) using semiconductor quantum dot nanocrystal (NC) luminophores. Over 200 million systematically varied NC-LED designs have been simulated to understand feasible performance in terms of CRI vs. LER. We evaluated the effects of design parameters including peak emission wavelength, full-width-at-half-maximum, and relative amplitudes of each NC color component on LED performance. Warm-white LEDs with CRI >90 and LER >380 lm/W at a correlated color temperature of 3000 K are shown to be achieved using nanocrystal luminophores. (C) 2009 Optical Society of America
      Keywords
      Color
      Nanocrystals
      Photometry
      Semiconductor Diodes
      Semiconductor Quantum Dots Color Component
      Color Rendering Index
      Correlated Color Temperature
      Design Parameters
      High Color Rendering Index
      High Luminous Efficacy
      Luminophores
      Luminous Efficacy
      Optical Radiations
      Peak Emission Wavelength
      Quantum Dot
      Relative Amplitude
      White Led
      Light Emitting Diodes
      Nanomaterial
      Quantum Dot
      Article
      Chemistry
      Color
      Colorimetry
      Computer Aided Design
      Equipment
      Equipment Design
      Illumination
      Instrumentation
      Luminescence
      Methodology
      Nanotechnology
      Optical Instrumentation
      Photometry
      Refractometry
      Reproducibility
      Semiconductor
      Sensitivity And Specificity
      Color
      Colorimetry
      Computer-aided Design
      Equipment Design
      Equipment Failure Analysis
      Lighting
      Luminescent Measurements
      Nanostructures
      Nanotechnology
      Optical Devices
      Photometry
      Quantum Dots
      Refractometry
      Reproducibility Of Results
      Semiconductors
      Sensitivity And Specificity
      Permalink
      http://hdl.handle.net/11693/11874
      Published Version (Please cite this version)
      http://dx.doi.org/10.1364/OE.18.000340
      Collections
      • Department of Electrical and Electronics Engineering 3702
      • Department of Physics 2397
      • Institute of Materials Science and Nanotechnology (UNAM) 1930
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