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dc.contributor.authorOguzer, T.en_US
dc.contributor.authorAltintas, A.en_US
dc.contributor.authorNosich, A. I.en_US
dc.date.accessioned2015-07-28T11:58:45Z
dc.date.available2015-07-28T11:58:45Z
dc.date.issued2009-06-09en_US
dc.identifier.issn1084-7529
dc.identifier.urihttp://hdl.handle.net/11693/11783
dc.description.abstractA two-dimensional reflector with resistive-type boundary conditions and varying resistivity is considered. The incident wave is a beam emitted by a complex-source-point feed simulating an aperture source. The problem is formulated as an electromagnetic time-harmonic boundary value problem and cast into the electric field integral equation form. This is a Fredholm second kind equation that can be solved numerically in several ways. We develop a Galerkin projection scheme with entire-domain expansion functions defined on an auxiliary circle and demonstrate its advantage over a conventional moment-method solution in terms of faster convergence. Hence, larger reflectors can be computed with a higher accuracy. The results presented relate to the elliptic, parabolic, and hyperbolic profile reflectors fed by in-focus feeds. They demonstrate that a partially or fully resistive parabolic reflector is able to form a sharp main beam of the far-field pattern in the forward half-space; however, partial transparency leads to a drop in the overall directivity of emission due to the leakage of the field to the shadow half-space. This can be avoided if only small parts of the reflector near the edges are made resistive, with resisitivity increasing to the edge.en_US
dc.language.isoEnglishen_US
dc.source.titleJournal of the Optical Society of America Aen_US
dc.relation.isversionofhttp://dx.doi.org/10.1364/JOSAA.26.001525en_US
dc.subjectDifferential equationsen_US
dc.subjectElectric fieldsen_US
dc.subjectIntegral equationsen_US
dc.subjectMethod of momentsen_US
dc.titleIntegral equation anlaysis of an arbitrary-profile and varying-resistivity cylindrical reflector illuminated by an E-polarized complex-source-point beamen_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage1525en_US
dc.citation.epage1532en_US
dc.citation.volumeNumber26en_US
dc.citation.issueNumber7en_US
dc.identifier.doi10.1364/JOSAA.26.001525en_US
dc.publisherOptical Society of Americaen_US


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