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dc.contributor.authorOral, A.en_US
dc.contributor.authorGrimble, R. A.en_US
dc.contributor.authorOzer, H. O.en_US
dc.contributor.authorPethica, J. B.en_US
dc.date.accessioned2015-07-28T11:57:19Z
dc.date.available2015-07-28T11:57:19Z
dc.date.issued2003-06-23en_US
dc.identifier.issn0034-6748
dc.identifier.urihttp://hdl.handle.net/11693/11284
dc.description.abstractWe describe a new, highly sensitive noncontact atomic force microscope/scanning tunneling microscope (STM) operating in ultrahigh vacuum (UHV) with subangstrom oscillation amplitudes for atomic resolution imaging and force-distance spectroscopy. A novel fiber interferometer with similar to4x10(-4) A/rootHz noise level is employed to detect cantilever displacements. Subangstrom oscillation amplitude is applied to the lever at a frequency well below the resonance and changes in the oscillation amplitude due to tip-sample force interactions are measured with a lock-in amplifier. Quantitative force gradient images can be obtained simultaneously with the STM topography. Employment of subangstrom oscillation amplitudes lets us perform force-distance measurements, which reveal very short-range force interactions, consistent with the theory. Performance of the microscope is demonstrated with quantitative atomic resolution images of Si(111)(7x7) and force-distance curves showing short interaction range, all obtained with <0.25 Angstrom lever oscillation amplitude. Our technique is not limited to UHV only and operation under liquids and air is feasible. (C) 2003 American Institute of Physics.en_US
dc.language.isoEnglishen_US
dc.source.titleReview of Scientific Instrumentsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.1593786en_US
dc.subjectSurfaceen_US
dc.subjectTemperatureen_US
dc.titleHigh-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopyen_US
dc.typeArticleen_US
dc.departmentDepartment of Physicsen_US
dc.citation.spage3656en_US
dc.citation.epage3663en_US
dc.citation.volumeNumber7en_US
dc.citation.issueNumber8en_US
dc.identifier.doi10.1063/1.1593786en_US
dc.publisherAmerican Institute of Physicsen_US


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