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      • Department of Electrical and Electronics Engineering
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      Simulations of switching vibrating cantilever in atomic force microscopy

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      Author
      Balantekin, M.
      Atalar, Abdullah
      Date
      2003-01-31
      Source Title
      Applied Surface Science
      Print ISSN
      0169-4332
      Publisher
      Elsevier
      Volume
      205
      Issue
      4-Jan
      Pages
      86 - 96
      Language
      English
      Type
      Article
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      Abstract
      We analyze the steady state tip sample interaction in atomic force microscopy by using an electrical circuit simulator. The phase shift between the cantilever excitation and tip, and the amplitude versus distance curves are obtained with sample stiffness as a parameter. The height shifts and hysteresis in amplitude and phase curves are observed as a result of the influence of the force between the tip and the sample. The damping and switching mechanisms are explained using the force traces obtained from simulations. The oscillation amplitude dependence of operating mode is inspected. We find that improper selection of the free tip oscillation amplitude is the cause of operating state transitions. (C) 2002 Elsevier Science B.V. All rights reserved.
      Keywords
      Tip oscillations
      Switching
      Damping
      Hysterisis
      Permalink
      http://hdl.handle.net/11693/11261
      Published Version (Please cite this version)
      http://dx.doi.org/10.1016/S0169-4332(02)01083-8
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