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      Optimization of the annealed proton exchange method with controlled annealing for multifunctional integrated optical chip production

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      Author(s)
      Asık, Fatma Yasemin
      Gökkavas, Mutlu
      Öztekin, Evren
      Karagöz, Ercan
      Ceylan, Abdullah
      Özbay, Ekmel
      Date
      2022-10-20
      Source Title
      Applied Optics
      Print ISSN
      1559-128X
      Electronic ISSN
      2155-3165
      Publisher
      Optica
      Volume
      61
      Issue
      30
      Pages
      8898 - 8903
      Language
      English
      Type
      Article
      Item Usage Stats
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      Abstract
      The main objective of our studyis to develop a new approach to the annealed proton exchange (APE) method for the fabrication of the multifunctional integrated optical chip (MIOC) used in fiber-optic gyro systems and to eliminate the loss of time and material, especially in mass production applications. In this work, self-polarized waveguides, which are the basic components of a MIOC device, were produced by the APE method and studied. With the developed method, controlled annealing trials have been carried out from a certain region on the LiNbO3 substrate used in waveguide production, and the annealing time specific to the annealing process was determined. By utilizing a special setup for the hot acid process, the proton exchange process was accomplished without a sudden temperature change of the substrate. Using prism coupling measurements of the fabricated waveguides, annealing times were determined to obtain index change values suitable for 45%–50% optical throughput. Mode profiles of devices with high optical throughput that were produced by the proposed method were measured, and it was seen that devices from different proton exchange runs had similar profiles. As a result, many undamaged substrates were fabricated, and their optical quality was found to be within the expected values.
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      http://hdl.handle.net/11693/111557
      Published Version (Please cite this version)
      https://doi.org/10.1364/AO.469479
      Collections
      • Department of Electrical and Electronics Engineering 4011
      • Department of Physics 2550
      • Nanotechnology Research Center (NANOTAM) 1179
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