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      Simple and high-sensitivity dielectric constant measurement using a high-directivity microstrip coupled-line directional coupler

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      Author(s)
      Rahimian Omam, Zahra
      Nayyeri, Vahid
      Javid-Hosseini, Sayyed-Hossein
      Ramahi, Omar M.
      Date
      2022-06-23
      Source Title
      IEEE Transactions on Microwave Theory and Techniques
      Print ISSN
      0018-9480
      Electronic ISSN
      1557-9670
      Publisher
      IEEE
      Volume
      70
      Issue
      8
      Pages
      3933 - 3942
      Language
      English
      Type
      Article
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      Abstract
      Simple methods using a microstrip coupled-line directional coupler (CLDC) are presented for dielectric constant measurements. The material under test (MUT) is placed on the coupled-line section of the coupler, and either the coupler’s coupling ( |S31| ) or its isolation level ( |S41| ) is considered as the sensor’s response. Putting different MUTs on the microstrip line leads to a change in the effective dielectric constant of the structure and consequently causing a change in the coupling coefficient. In addition, since the isolation level of a microstrip coupled-line coupler depends on the phase velocity difference between the substrate and the medium above the signal strips, putting different MUTs on the line significantly changes the isolation level. This change is significantly greater than the change in |S21| level of a microstrip line when loaded with different MUTs. Validation of the method is presented through measurements for both solid and liquid MUTs.
      Keywords
      Coupled-line directional coupler (CLDC)
      Dielectric constant measurement
      Material characterization
      Microwave sensors
      Permalink
      http://hdl.handle.net/11693/111420
      Published Version (Please cite this version)
      https://www.doi.org/10.1109/TMTT.2022.3183130
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      • Nanotechnology Research Center (NANOTAM) 1179
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