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      XPS and FTIR characterization of manganese ions deposited on alumina

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      Author(s)
      Kantcheva, M.
      Kucukkal, M. U.
      Süzer, Şefik
      Date
      1999-05-25
      Source Title
      Journal of Molecular Structure
      Print ISSN
      0022-2860
      Publisher
      Elsevier
      Volume
      482-483
      Pages
      19 - 22
      Language
      English
      Type
      Article
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      Abstract
      By application of XPS and FTIR spectroscopy of adsorbed CO the effect of preparation conditions on the state and localization of manganese ions deposited on h-Al2O3 is studied. Both Mn21 and Mn31 ions are observed on the impregnated sample. The sample obtained by ion exchange contains only Mn31 ions. The adsorbed CO species are identified. q 1999 Elsevier Science B.V. All rights reserved.
      Keywords
      Manganese on alumina
      XPS
      FTIR of adsorbed CO
      Permalink
      http://hdl.handle.net/11693/10962
      Published Version (Please cite this version)
      http://dx.doi.org/10.1016/S0022-2860(98)00834-5
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      • Department of Chemistry 640
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