XPS for chemical-and charge-sensitive analyses
Date
2013-05-01
Authors
Editor(s)
Advisor
Supervisor
Co-Advisor
Co-Supervisor
Instructor
Source Title
Thin Solid Films
Print ISSN
0040-6090
Electronic ISSN
1879-2731
Publisher
Elsevier
Volume
534
Issue
Pages
1 - 11
Language
English
Type
Journal Title
Journal ISSN
Volume Title
Series
Abstract
By recording X-ray photoelectron spectroscopic binding energy shifts, while subjecting samples to a variety of optical and electrical stimuli, information about charge accumulation on materials or surface structures can be obtained. These stimuli included d.c. as well as a.c. electrical and/or optical pulses covering a wide frequency range (10−3 to 106 Hz) for probing charging and/or photovoltage shifts, stemming from impurities, dopants, defects, etc., whether created intentionally or not. The methodology is simple to implement and provides several new dimensions for thin films and materials analyses.