Browsing by Subject "Equipment testing"
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Item Open Access Analysis of slotted sectoral waveguide arrays with multilayered radomes(Institute of Electrical and Electronics Engineers Inc., 2016) Kalfa, M.; Ertürk, V. B.A method of moments/Green's function (MoM/GF) technique in the space domain is used for the rigorous and fast analysis of cylindrically conformal slotted sectoral waveguide arrays (SSWGAs) in the presence of multilayered cylindrical dielectric radomes. Representing the slots by fictitious magnetic currents via the equivalence principle, the geometry is divided into two regions and separate GF representations for each region are developed to be used in conjunction with the MoM procedure. Particularly, in the region that constitutes the cylindrically stratified medium, the newly developed closed-form GF representations for magnetic currents are valid for all source and observation points, including the source region (where source and observation points are on the top of each other). Basic performance metrics of an SSWGA such as equivalent slot currents, S-parameters, radiation patterns in the presence of a multilayered cylindrical radome are presented to assess the accuracy and efficiency of the proposed technique. © 1963-2012 IEEE.Item Open Access Computer-controlled characterization of high-voltage, high-frequency SiC devices?(IEEE, 2006) Ortiz-Rodriguez, J. M.; Hefner, A. R.; Berning, D.; Hood, C.; Ölçüm, SelimA software-based high-voltage curve tracer application for SiC device characterization is presented. This flexible application interface is developed to define testing parameters needed to control the hardware of a custom-made 25 kV-capable SiC characterization test bed. Data acquisition is controlled for optimum resolution, and I-V characterization is computed by means of a user-defined time interval based on the shape of the applied power pulses. Both voltage and current waveforms are displayed for each data point captured to allow the user to observe transient effects. Additionally, the software allows archiving some or all of these transient waveforms. Acquired results are shown to demonstrate functionality and flexibility of the new system.Item Open Access A run-time verification framework for smart grid applications implemented on simulation frameworks(IEEE, 2013-05) Çıracı, Selim; Sözer, Hasan; Tekinerdoğan, BedirSmart grid applications are implemented and tested with simulation frameworks as the developers usually do not have access to large sensor networks to be used as a test bed. The developers are forced to map the implementation onto these frameworks which results in a deviation between the architecture and the code. On its turn this deviation makes it hard to verify behavioral constraints that are described at the architectural level. We have developed the ConArch toolset to support the automated verification of architecture-level behavioral constraints. A key feature of ConArch is programmable mapping for architecture to the implementation. Here, developers implement queries to identify the points in the target program that correspond to architectural interactions. ConArch generates runtime observers that monitor the flow of execution between these points and verifies whether this flow conforms to the behavioral constraints. We illustrate how the programmable mappings can be exploited for verifying behavioral constraints of a smart grid application that is implemented with two simulation frameworks. © 2013 IEEE.