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dc.contributor.authorCakmak O.en_US
dc.contributor.authorKilinc, N.en_US
dc.contributor.authorErmek, E.en_US
dc.contributor.authorMostafazadeh, A.en_US
dc.contributor.authorElbuken, C.en_US
dc.contributor.authorYaralioglu, G. G.en_US
dc.contributor.authorUrey, H.en_US
dc.date.accessioned2016-02-08T12:03:30Z
dc.date.available2016-02-08T12:03:30Z
dc.date.issued2014en_US
dc.identifier.issn1084-6999
dc.identifier.urihttp://hdl.handle.net/11693/27870
dc.description.abstractThis paper reports a MEMS-based sensor array enabling multiple clot-time tests in one disposable microfluidic cartridge using plasma. The versatile LoC (Lab-on-Chip) platform technology is demonstrated here for real-time coagulation tests (activated Partial Thrompoblastin Time (aPTT) and Prothrombin Time (PT)). The system has a reader unit and a disposable cartridge. The reader has no electrical connections to the cartridge, which consists of multiple microfluidic channels and MEMS microcantilevers placed in each channel. Microcantilevers are made of electro-plated nickel and actuated remotely using an external electro-coil. The read-out is also conducted remotely by a laser and the phase of the MEMS oscillator is monitored real-time. The system is capable of monitoring coagulation time with a precision estimated at 0.1sec.en_US
dc.language.isoEnglishen_US
dc.source.titleInternational Conference on Micro Electro Mechanical Systemsen_US
dc.relation.isversionofhttps://doi.org/10.1109/MEMSYS.2014.6765643en_US
dc.subjectCoagulationen_US
dc.subjectComposite micromechanicsen_US
dc.subjectElectric connectorsen_US
dc.subjectMicroprocessor chipsen_US
dc.subjectProjectilesen_US
dc.subjectSensorsen_US
dc.subjectCoagulation testsen_US
dc.subjectDisposable cartridgeen_US
dc.subjectElectrical connectionen_US
dc.subjectMEMS-based sensorsen_US
dc.subjectMicro-cantileversen_US
dc.subjectMicrofluidic channelen_US
dc.subjectPlatform technologyen_US
dc.subjectProthrombin timeen_US
dc.subjectMEMSen_US
dc.titleLoC sensor array platform for real-time coagulation measurementsen_US
dc.typeConference Paperen_US
dc.departmentNanotechnology Research Center - NANOTAMen_US
dc.citation.spage330en_US
dc.citation.epage333en_US
dc.identifier.doi10.1109/MEMSYS.2014.6765643en_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US


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