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dc.contributor.authorAlkis, S.en_US
dc.contributor.authorÖztaş, T.en_US
dc.contributor.authorAygün L.E.en_US
dc.contributor.authorBozkurt F.en_US
dc.contributor.authorOkyay, A., K.en_US
dc.contributor.authorOrtaç, B.en_US
dc.date.accessioned2016-02-08T09:44:51Z
dc.date.available2016-02-08T09:44:51Z
dc.date.issued2012en_US
dc.identifier.issn10944087
dc.identifier.urihttp://hdl.handle.net/11693/21329
dc.description.abstractWe report on the development of UV range photodetector based on molybdenum disulfide nanocrystals (MoS2-NCs). The inorganic MoS2- NCs are produced by pulsed laser ablation technique in deionized water and the colloidal MoS2-NCs are characterized by transmission electron microscopy, Raman spectroscopy, X-ray diffraction and UV/VIS absorption measurements. The photoresponse studies indicate that the fabricated MoS 2- NCs photodetector (MoS2-NCs PD) operates well within 300-400 nm UV range, with diminishing response at visible wavelengths, due to the MoS2- NCs absorption characteristics. The structural and the optical properties of laser generated MoS2-NCs suggest promising applications in the field of photonics and optoelectronics. © 2012 Optical Society of America.en_US
dc.language.isoEnglishen_US
dc.source.titleOptics Expressen_US
dc.relation.isversionofhttp://dx.doi.org/10.1364/OE.20.021815en_US
dc.subjectDeionized wateren_US
dc.subjectMolybdenumen_US
dc.subjectNanocrystalsen_US
dc.subjectOptical propertiesen_US
dc.subjectPhotodetectorsen_US
dc.subjectRaman spectroscopyen_US
dc.subjectTransmission electron microscopyen_US
dc.subjectWater absorptionen_US
dc.subjectX ray diffractionen_US
dc.subjectAbsorption characteristicsen_US
dc.subjectAbsorption measurementsen_US
dc.subjectMolybdenum disulfideen_US
dc.subjectPhotoresponsesen_US
dc.subjectUltra-violet photodetectorsen_US
dc.subjectVisible wavelengthsen_US
dc.subjectMolybdenum compoundsen_US
dc.titleThin film MoS2 nanocrystal based ultraviolet photodetectoren_US
dc.typeArticleen_US
dc.departmentUNAM - Institute of Materials Science and Nanotechnology
dc.departmentDepartment of Electrical and Electronics Engineering
dc.citation.spage21815en_US
dc.citation.epage21820en_US
dc.citation.volumeNumber20en_US
dc.citation.issueNumber19en_US
dc.identifier.doi10.1364/OE.20.021815en_US
dc.publisherOptical Society of American (OSA)en_US


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