Now showing items 1-3 of 3

    • Integrated Piezoresistive Sensors for AFM-Guided Scanning Hall Probe Microscopy 

      Brook, J.; Bending, S. J.; Pinto, J.; Oral, A.; Ritchie, D.; Beere, H.; Henini, M.; Springthorpe, A. (American Institute of Physics, 2003)
      We report the development of an advanced sensor for atomic force-guided scanning Hall probe microscopy whereby both a high mobility heterostructure Hall effect magnetic sensor and an n-Al0.4Ga0.6As piezoresistive displacement ...
    • Micromachined III-V cantilevers for AFM-tracking scanning Hall probe microscopy 

      Brook, A. J.; Bending, S. J.; Pinto, J.; Oral, A.; Ritchie, D.; Beere, H.; Springthorpe, A.; Henini, M. (Institute of Physics, 2003)
      In this paper we report the development of a new III-V cantilever-based atomic force sensor with piezoresistive detection and an integrated Hall probe for scanning Hall probe microscopy. We give detailed descriptions of ...
    • Scanning Hall probe microscopy (SHPM) using quartz crystal AFM feedback 

      Dede, Münir; Ürkmen, Koray; Girişen, Ö.; Atabak, Mehrdad; Oral, Ahmet; Farrer, I.; Ritchie, D. (American Scientific Publishers, 2007)
      Scanning Hall Probe Microscopy (SHPM) is a quantitative and non-invasive technique for imaging localized surface magnetic field fluctuations such as ferromagnetic domains with high spatial and magnetic field resolution of ...