Now showing items 101-105 of 105
Analysis of surface structures using XPS with external stimuli
(Springer, Dordrecht, 2006)
X-ray Photoelectron Spectroscopy, XPS, due to the perfect match of its probe length (1-10 nm) to nanoparticle size, chemical specificity, and susceptibility to electrical charges, is ideally suited for harvesting chemical, ...
Electrical and chemical characterization of chemically passivated silicon surfaces
The surface composition of chemically passivated silicon substrates is investigated using XPS and FTIR techniques. The samples are passivated with methanol, quinhydrone-methanol and iodine-methanol solution after HF ...
Sorption of Cs+ and Ba2+ on magnesite
(Cambridge University Press, 1998)
Sorption behavior of Cs and Ba ions on magnesite was studied using the radiotracer method complemented by X-ray photoelectron spectroscopy. Cs and Ba were used as radiotracers. The sorption of Cs is seen to be temperature ...
Tribological interaction between polytetrafluoroethylene and silicon oxide surfaces
(AIP Publishing LLC, 2014)
We investigated the tribological interaction between polytetrafluoroethylene (PTFE) and silicon oxide surfaces. A simple rig was designed to bring about a friction between the surfaces via sliding a piece of PTFE on a ...
Electrical circuit modeling of surface structures for X-ray photoelectron spectroscopic measurements
(Elsevier BV * North-Holland, 2008)
We model the X-ray photoelectron spectrometer and the sample with lumped electrical circuit elements, and simulate various types of conditions using a widely used computer program (PSpice) and compare the results with ...