Now showing items 1-5 of 5
Dual integrated actuators for extended range high speed atomic force microscopy
(A I P Publishing LLC, 1999-09-13)
A flexible system for increasing the throughput of the atomic force microscope without sacrificing imaging range is presented. The system is based on a nested feedback loop which controls a micromachined cantilever that ...
Nanometer-scale patterning and individual current-controlled lithography using multiple scanning probes
(A I P Publishing LLC, 1999-06)
Scanning probe lithography (SPL) is capable of sub-30-nm-patterning resolution and nanometer-scale alignment registration, suggesting it might provide a solution to the semiconductor industry’s lithography challenges. ...
Noise analysis of geometrically complex mechanical structures using the analogy between electrical circuits and mechanical systems
(A I P Publishing LLC, 1999-05)
Random ﬂuctuations of displacement or velocity in mechanical systems can be calculated by using the analogy between electrical circuits and mechanical systems. The ﬂuctuation-dissipation theorem expresses the relation ...
An electrical circuit theoretical method for time-and frequency-domain solutions of the structural mechanics problems
(John Wiley & Sons Ltd., 1999)
Shrinking device dimensions in integrated circuit technology made integrated circuits with millions of components a reality. As a result of this advance, electrical circuit simulators that can handle very large number of ...
Theory and analysis of electrode size optimization for capacitive microfabricated ultrasonic transducers
(Institute of Electrical and Electronics Engineers, 1999-11)
Theoretical analysis and computer simulations of capacitive microfabricated ultrasonic transducers indicate that device performance can be optimized through judicious patterning of electrodes. The conceptual basis of the ...