Now showing items 1-2 of 2
Noncontact atomic force microscopy for atomic-scale characterization of material surfaces
Among the large variety of scanning probe microscopy techniques, noncontact atomic force microscopy (NC-AFM) stands out with its capability of atomic-resolution imaging and spectroscopy measurements on conducting, ...
Atomic force microscopy: Methods and applications
This chapter provides an overview of atomic force microscopy, covering the fundamental aspects of the associated instrumentation and methodology as well as representative results from the literature highlighting a variety ...