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    • Data imputation through the identification of local anomalies 

      Ozkan, H.; Pelvan, O. S.; Kozat, S. S. (Institute of Electrical and Electronics Engineers Inc., 2015)
      We introduce a comprehensive and statistical framework in a model free setting for a complete treatment of localized data corruptions due to severe noise sources, e.g., an occluder in the case of a visual recording. Within ...