Browsing by Keywords "Si(001)(‘2 x i ) reconstruction"
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Atomic scale investigation of clean and epi-grown Si(001) surfaces using scanning tunneling microscopy (Bilkent University, 1996)In this thesis, clean and epi-grown Si(001)(2x1)surfaces are analyzed by Scanning Tunneling Microscopy (STM). The STM and Ultra High Vacuum System (UHV) in which the microscope is installed, are described. A brief history ...