Browsing by Keywords "Scanning tunneling microscopy"
Now showing items 1-13 of 13
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50 nm Hall Sensors for Room Temperature Scanning Hall Probe Microscopy
(Institute of Physics Publishing, 2004)Bismuth nano-Hall sensors with dimensions ∼50nm × 50 nm were fabricated using a combination of optical lithography and focused ion beam milling. The Hall coefficient, series resistance and optimum magnetic field sensitivity ... -
Artifacts related to tip asymmetry in high-resolution atomic force microscopy and scanning tunneling microscopy measurements of graphitic surfaces
(American Institute of Physics Inc., 2015)The effect of tip asymmetry on atomic-resolution scanning tunneling microscopy and atomic force microscopy measurements of graphitic surfaces has been investigated via numerical simulations. Employing a three-dimensional, ... -
Atomic force microscopy: Methods and applications
(Elsevier, 2017)This chapter provides an overview of atomic force microscopy, covering the fundamental aspects of the associated instrumentation and methodology as well as representative results from the literature highlighting a variety ... -
Direct magnetic imaging of ferromagnetic domain structures by room temperature scanning hall probe microscopy using a bismuth micro-Hall probe
(Japan Society of Applied Physics, 2001)A bismuth micro-Hall probe sensor with an integrated scanning tunnelling microscope tip was incorporated into a room temperature scanning Hall probe microscope system and successfully used for the direct magnetic imaging ... -
Electronic structure of low dimensional semiconductor systems
(Bilkent University, 1992)Recent progress made in the growth techniques has led to the fabrication of the artificial semiconductor systems of lower dimension. Electrons and holes in these materials have quantization different from those of the ... -
Initial stages of Pt growth on Ge (001) studied by scanning tunneling microscopy and density functional theory
(American Physical Society, 2004)We have studied the initial stages of submonolayer Pt growth on the Ge(001). We have observed several stable and meta-stable adsorption configurations of Pt atoms at various temperatures. Calculations indicate relatively ... -
Initial stages of SiGe epitaxy on Si(001) studied by scanning tunneling microscopy
(Elsevier BV, 1995)We have studied the initial stages of strained SiGe alloy growth on the Si(001)-(2 × 1) surface by scanning tunneling microscopy. The Si0.36Ge0.64 alloy was grown on the silicon substrate at various coverages (0.13-3.6 ML) ... -
Low-amplitude, force gradient imaging of Cu(100) surface using tunnel current feedback
(Institute of Physics Publishing, 2004)The large corrugation amplitudes in scanning tunnelling microscope (STM) images of metal surfaces have been commonly attributed to the action of forces between the tip and the sample. We have investigated the Cu(100) surface ... -
Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy
(2009)In this work, the authors report on a quantitative investigation of lateral-force gradient and lateral force between a tungsten tip and Si (111) - (7×7) surface using combined noncontact lateral-force microscopy and scanning ... -
On the structural and electronic properties of Ir-silicide nanowires on Si(001) surface
(American Institute of Physics Inc., 2016)Iridium (Ir) modified Silicon (Si) (001) surface is studied with Scanning Tunneling Microscopy/Spectroscopy (STM/STS) and Density Functional Theory (DFT). A model for Ir-silicide nanowires based on STM images and ab-initio ... -
Scanning Hall probe microscopy (SHPM) using quartz crystal AFM feedback
(American Scientific Publishers, 2007)Scanning Hall Probe Microscopy (SHPM) is a quantitative and non-invasive technique for imaging localized surface magnetic field fluctuations such as ferromagnetic domains with high spatial and magnetic field resolution of ... -
Simultaneous measurement of multiple independent atomic-scale interactions using scanning probe microscopy: data interpretation and the effect of cross-talk
(American Chemical Society, 2015)In high-resolution scanning probe microscopy, it is becoming increasingly common to simultaneously record multiple channels representing different tip-sample interactions to collect complementary information about the ... -
Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes
(Elsevier Science B.V., 2002)Si(1 0 0)(2 × 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Ångström oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual ...
