Now showing items 1-4 of 4

    • Noncontact atomic force microscopy II 

      Baykara, M. Z.; Schwarz, U. D. (Beilstein-Institut Zur Forderung der Chemischen Wissenschaften, 2014)
    • Noncontact atomic force microscopy III 

      Baykara, M. Z.; Schwarz, U. D. (Beilstein-Institut Zur Forderung der Chemischen Wissenschaften, 2016-06)
    • Novel integrated optical displacement sensor for scanning force microscopies 

      Aydınlı, Atilla; Kıyat, İsa; Kocabaş, Coşkun (IEEE, 2003)
      A novel displacement sensor for scanning force microscoples using an integrated optical micro-ring resonator is described. Device operates by monitoring the changes in transmission spectrum of micro-ring resonator. This ...
    • Theory of tip—sample interactions 

      Çıracı, Salim (Springer, 1993)
      In conventional, Scanning Tunneling Microscopy (STM) the tip—sample separation is assumed to be sufficiently large to allow only weak coupling between the electronic states. In this case the electrodes have been considered ...