Now showing items 1-3 of 3

    • Grating loaded integrated optical cantilevers 

      Karademir, Ertuğrul (Bilkent University, 2010)
      Cantilever beams are the most important parts of standard scanning probe microscopy. In this work, an integrated optical approach to sense the deflection of a cantilever beam is suggested and realized. A grating coupler ...
    • Integrated optical displacement sensors for scanning force microscopies 

      Kocabaş, Coşkun (Bilkent University, 2003)
      In this thesis, we have studied the use of integrated optical waveguide devices acting as integrated displacement sensors on cantilevers for scanning probe microscopes. These displacement sensors include integrated optical ...
    • Investigation of lateral forces in dynamic mode using combined AFM/STM 

      Atabak, Mehrdad (Bilkent University, 2007)
      In this Ph.D. work, we constructed a ¯ber optic interferometer based non-contact Atomic Force Microscope (nc-AFM) combined with Scanning Tunneling Micro- scope(STM) to study lateral force interactions on Si(111)-(77) ...