Browsing by Keywords "Rh(111)"
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Band alignment issues related to HfO2/SiO2/p-Si gate stacks
(American Institute of Physics, 2004-12-15)The valence and conduction band densities of states for the HfO2/SiO2/Si structure are determined by soft x-ray photoemission and inverse photoemission. First principles calculations are used to help in assigning valence ...