Now showing items 1-2 of 2

    • Fabrication of 100 nm pMOSFETS With Hybrid AFW / STM lithography 

      Soh, H. T.; Wilder, K.; Atalar, Abdullah; Quate, C. F. (IEEE, 1997-06)
      Scanning probe lithography (SPL) is an emerging area of research in which the scanning tunneling microscope (STM) or atomic force microscope (AFM) is used to pattern nanometer-scale features. Four factors will dictate ...
    • Gate bias characterization of CNT-TFT DNA sensors 

      Aktaş, Özgür; Töral, Taylan (IEEE, 2009-12)
      This paper follows the approach in the works of Gui et al. (2007), that use the change in the current of carbon nanotube thin film transistors (CNT-TFT) with DNA attachment and DNA hybridization. The authors have studied ...