Now showing items 1-2 of 2

    • Computer-controlled characterization of high-voltage, high-frequency SiC devices? 

      Ortiz-Rodriguez, J. M.; Hefner, A. R.; Berning, D.; Hood, C.; Ölçüm, Selim (IEEE, 2006)
      A software-based high-voltage curve tracer application for SiC device characterization is presented. This flexible application interface is developed to define testing parameters needed to control the hardware of a custom-made ...
    • Design, fabrication, and characterization of normally-off GaN HEMTS 

      Gülseren, Melisa Ekin (Bilkent University, 2019-07)
      GaN-based high-electron-mobility transistors (HEMTs) have been developing rapidly from the time when they were first demonstrated in the 1990s. They have consistently been presented as a displacement technology to silicon ...