Browsing by Keywords "Photoelectrons"
Now showing items 1-8 of 8
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Electrical properties from photoinduced charging on Cd-doped (100) surfaces of CuInSe2 epitaxial thin films
(AVS Science and Technology Society, 2016)The photoresponse of Cd-doped CuInSe2 (CIS) epitaxial thin films on GaAs(100) was studied using x-ray photoelectron spectroscopy under illumination from a 532 nm laser between sample temperatures of 28-260 °C. The initial, ... -
Low-temperature grown wurtzite InxGa1−xN thin films via hollow cathode plasma-assisted atomic layer deposition
(Royal Society of Chemistry, 2015-08)Herein, we report on atomic layer deposition of ternary InxGa1−xN alloys with different indium contents using a remotely integrated hollow cathode plasma source. Depositions were carried out at 200 °C using organometallic ... -
Modeling photoelectron spectra of conjugated oligomers with time-dependent density functional theory
(American Chemical Society, 2010)With the aim of producing accurate band structures of conjugated systems by employing the states of cations, TDDFT calculations on conjugated oligomer radical cations of thiophene, furan, and pyrrole with one to eight rings ... -
Preparation of Al 2O 3and AlN nanotubes by atomic layer deposition
(Cambridge University Press, 2012)Al 2O 3 and AlN nanotubes were fabricated by depositing conformal thin films via atomic layer deposition (ALD) on electrospun nylon 66 (PA66) nanofiber templates. Depositions were carried out at 200°C, using trimethylaluminum ... -
SiGe nanocrystal formation in PECVD grown SiOx/Si/Ge/Si/SiOx multilayers
(World Scientific Publishing, 2009)We have studied alternating gennanium-silicon-silicon oxide layers of 41 nm thickness grown on Si substrates by plasma enhanced chemically vapor deposition. The compositions of the grown films were detennined by X-ray ... -
Voltage contrast X-ray photoelectron spectroscopy reveals graphene-substrate interaction in graphene devices fabricated on the C-and Si-faces of SiC
(American Institute of Physics Inc., 2015)We report on an X-ray photoelectron spectroscopy (XPS) study of two graphene based devices that were analyzed by imposing a significant current under +3 V bias. The devices were fabricated as graphene layers(s) on hexagonal ... -
X-ray photoelectron spectroscopy for identification of morphological defects and disorders in graphene devices
(AIP Publishing, 2016)The progress in the development of graphene devices is promising, and they are now considered as an option for the current Si-based electronics. However, the structural defects in graphene may strongly influence the local ... -
XPS characterization of Au (core)/SiO2 (shell) nanoparticles
(American Chemical Society, 2005)Core-shell nanoparticles with ca. 15-nm gold core and 6-nm silica shell were prepared and characterized by XPS. The Au/Si atomic ratio determined by XPS is independent of the electron takeoff angle because of the concentric ...
