Now showing items 1-2 of 2

    • Analysis of surface structures using XPS with external stimuli 

      Ertaş, Gülay; Süzer, Şefik (Springer, Dordrecht, 2006)
      X-ray Photoelectron Spectroscopy, XPS, due to the perfect match of its probe length (1-10 nm) to nanoparticle size, chemical specificity, and susceptibility to electrical charges, is ideally suited for harvesting chemical, ...
    • Enhanced peak separation in XPS with external biasing 

      Ertas, G.; Demirok, U. K.; Süzer, Şefik (Elsevier, 2005-08-15)
      We have demonstrated that the An 4f peaks of the capped gold nanoparticles deposited on a SiO2 (20 nm)/Si substrate can be separated form the An 4f peaks of a gold metal strip, in contact with the same sample, by application ...