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    • Linear measurements of nanomechanical phenomena using small-amplitude AFM 

      Hoffmann P.M.; Patil, S.; Matei G.; Tanulku, A.; Grimble, R.; Özer Ö.; Jeffery, S.; Oral, Ahmet; Pethica J. (2004)
      Dynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. ...