Browsing by Keywords "Finite element analysis"
Now showing items 1-12 of 12
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Algebraic reconstraction for 3D magnetic resonance-electrical impedance tomography (MREIT) using one component of magnetic flux density
(Institute of Physics and Engineering in Medicine, 2004)Magnetic resonance-electrical impedance tomography (MREIT) algorithms fall into two categories: those utilizing internal current density and those utilizing only one component of measured magnetic flux density. The latter ... -
Design and development of X-band GaN-based low-noise amplifiers
(Bilkent University, 2022-12)Gallium nitride (GaN) high electron mobility transistor (HEMT) technology emerged as a preferable candidate for high-power applications. GaN HEMTs on silicon carbide (SiC) substrate provide the best combination of speed ... -
Erratum to "Equivalent circuit-based analysis of CMUT cell dynamics in arrays" [May 13 1016-1024]
(IEEE, 2013-06-03)In the original publication of the paper [1], the funding source was inadvertently omitted from the footnote on page 1016. The footnote should have read "Manuscript received November 20, 2012; accepted February 14, 2013. ... -
Experimental results for 2D magnetic resonance electrical impedance tomography (MR-EIT) using magnetic flux density in one direction
(Institute of Physics Publishing, 2003)Magnetic resonance electrical impedance tomography (MR-EIT) is an emerging imaging technique that reconstructs conductivity images using magnetic flux density measurements acquired employing MRI together with conventional ... -
Finite element analysis of the deformation behaviour of pure aluminium in repetitive corrugation-straightening and constrained groove pressing
(Inderscience Enterprises, 2018)Repetitive corrugation-straightening (RCS) and constrained groove pressing (CGP) are two promising severe plastic deformation techniques for sheet metallic materials. There are differences in amount of imposed plastic ... -
Identification of internal process parameters of micro milling considering machined surface topography
(Bilkent University, 2022-07)Micro-milling is a fast and versatile machining method that can be used to manufacture three-dimensional parts of a wide range of materials with high accuracy. Modeling of micro-milling processes is complex due to size ... -
Influence of crown margin design on the stress distribution in maxillary canine restored by all-ceramic crown: a finite element analysis
(Korean Academy of Dental Sciences, 2015)Purpose: To investigate the infl uence of crown margin design on the stress distribution and to localize critical sites in maxillary canine under functional loading by using three dimensional fi nite element analysis. Materials ... -
Magnetic resonance electrical impedance tomography (MREIT) based on the solution of the convection equation using FEM with stabilization
(Institute of Physics Publishing, 2012-07-27)Most algorithms for magnetic resonance electrical impedance tomography (MREIT) concentrate on reconstructing the internal conductivity distribution of a conductive object from the Laplacian of only one component of the ... -
Nonlinear modeling of an immersed transmitting capacitive micromachined ultrasonic transducer for harmonic balance analysis
(IEEE, 2010)Finite element method (FEM) is used for transient dynamic analysis of capacitive micromachined ultrasonic transducers (CMUT) and is particularly useful when the membranes are driven in the nonlinear regime. One major ... -
Optimization of the gain-bandwidth product of capacitive micromachined ultrasonic transducers
(IEEE, 2005-12)Capacitive micromachined ultrasonic transducers (cMUT) have large bandwidths, but they typically have low conversion efficiencies. This paper defines a performance measure in the form of a gain-bandwidth product and ... -
Reducing anchor loss in micromechanical extensional Mode resonators
(IEEE, 2010-02)In this work, we propose a novel method to increase the quality factor of extensional mode micromechanical resonators. The proposed resonator topology is suitable for integration in a silicon-based process to fabricate ... -
Unveiling Tmax inside GaN HEMT based X-band low-noise amplifier by correlating thermal simulations and IR thermographic measurements
(IEEE, 2022-12-20)This paper presents a method to reveal the channel temperature profile of high electron mobility transistors (HEMTs) in a multi-stage monolithic microwave integrated circuit (MMIC). The device used for this study is a ...
