Now showing items 1-2 of 2

    • Enhanced peak separation in XPS with external biasing 

      Ertas, G.; Demirok, U. K.; Suzer, S. (Elsevier, 2005-08-15)
      We have demonstrated that the An 4f peaks of the capped gold nanoparticles deposited on a SiO2 (20 nm)/Si substrate can be separated form the An 4f peaks of a gold metal strip, in contact with the same sample, by application ...
    • XPS analysis with external bias: a simple method for probing differential charging 

      Ertas, G.; Suzer, S. (John Wiley & Sons Ltd., 2004)
      The XPS spectra of thermally grown oxide layers on Si, Al, W and Hf substrates have been recorded while the samples were subjected to external d.c. voltage bias. The bias induces additional shifts in the measured binding ...