Now showing items 1-3 of 3

    • Electrostatic force spectroscopy of near surface localized states 

      Dâna, A.; Yamamoto, Y. (Institute of Physics Publishing Ltd., 2005)
      Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer ...
    • Reversible electrical reduction and oxidation of graphene oxide 

      Ekiz, O. O.; Ürel, M.; Güner, H.; Mizrak, A. K.; Dâna, A. (American Chemical Society, 2011)
      We demonstrate that graphene oxide can be reversibly reduced and oxidized using electrical stimulus. Controlled reduction and oxidation in two-terminal devices containing multilayer graphene oxide films are shown to result ...
    • Scanning probe microscopy for optoelectronic characterization at the nanoscale 

      Ürel, Mustafa (Bilkent University, 2010)
      In this work, we propose methods for electrical characterization of nanostructured surfaces using electrostatic force and tunneling current measurements in scanning probe microscopy. Resolution smaller than 10 nm in ...