Browsing by Keywords "Electronic equipment testing"

Now showing items 1-2 of 2

    • The design of finite-state machines for quantization using simulated annealing 

      Kuruoğlu, Ercan Engin; Ayanoğlu, E. (IEEE, 1993)
      In this paper, the combinatorial optimization algorithm known as simulated annealing is used for the optimization of the trellis structure or the next-state map of the decoder finite-state machine in trellis waveform coding. ...

    • Design of multi-octave band GaN-HEMT power amplifier 

      Eren, Gulesin; Şen, Özlem A.; Bölükbaş, Basar; Kurt, Gökhan; Arıcan, Orkun; Cengiz, Ömer; Ünal, Sıla T.K.; Durmuş, Yıldırım; Özbay, Ekmel (IEEE, 2012)
      This paper describes design, fabrication and measurement of 6 GHz - 18 GHz monolithic microwave integrated circuit (MMIC) amplifier. The amplifier is realized as coplanar waveguide (CPW) circuit using 0.3 μm-gate Gallium-Nitride ...