Now showing items 1-7 of 7

    • Analysis of surface structures using XPS with external stimuli 

      Ertaş, Gülay; Süzer, Şefik (Springer, Dordrecht, 2006)
      X-ray Photoelectron Spectroscopy, XPS, due to the perfect match of its probe length (1-10 nm) to nanoparticle size, chemical specificity, and susceptibility to electrical charges, is ideally suited for harvesting chemical, ...
    • Differential charging in x-ray photoelectron spectroscopy: a nuisance or a useful tool? 

      Suzer, S. (American Chemical Society, 2003)
      We apply a negative bias to the sample while recording an XPS spectrum to enhance differential (positive) charging. The enhanced differential charging is due to the repulsion of stray electrons from the sample, which ...
    • Electrical circuit modeling of surface structures for X-ray photoelectron spectroscopic measurements 

      Tasci, T. O.; Atalar, E.; Demirok, U. K.; Suzer, S. (Elsevier BV * North-Holland, 2008)
      We model the X-ray photoelectron spectrometer and the sample with lumped electrical circuit elements, and simulate various types of conditions using a widely used computer program (PSpice) and compare the results with ...
    • Enhanced peak separation in XPS with external biasing 

      Ertas, G.; Demirok, U. K.; Suzer, S. (Elsevier, 2005-08-15)
      We have demonstrated that the An 4f peaks of the capped gold nanoparticles deposited on a SiO2 (20 nm)/Si substrate can be separated form the An 4f peaks of a gold metal strip, in contact with the same sample, by application ...
    • XPS analysis with external bias: a simple method for probing differential charging 

      Ertas, G.; Suzer, S. (John Wiley & Sons Ltd., 2004)
      The XPS spectra of thermally grown oxide layers on Si, Al, W and Hf substrates have been recorded while the samples were subjected to external d.c. voltage bias. The bias induces additional shifts in the measured binding ...
    • XPS analysis with pulsed voltage stimuli 

      Karabudak, E.; Demirok, U. K.; Suzer, S. (2006)
      We record XPS spectra while applying 0 to +10 V or 0 to -10 V square pulses to the sample rod, which normally results in twinning of all peaks at correspondingly increased (for +10 V) or decreased (for -10 V) binding ...
    • XPS measurements for probing dynamics of charging 

      Suzer, S.; Sezen, H.; Ertas, G.; Dâna, A. (Elsevier, 2010)
      The technique of recording X-ray photoemission data while the sample rod is subjected to ±10.0 V (dc) or square-wave pulses (ac) with varying frequencies in the range of 10-3 to 103 Hz for probing charging/discharging ...